The Improvement of Reliability of High-k/Metal Gate  pMOSFET Device with Various PMA Conditions

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</svg> curve of pMOSFET with various PMA conditions before and after constant voltage stress.</table>

Active and Passive Electronic Components

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Figure 5

Figure 5: The Improvement of Reliability of High-k/Metal Gate  pMOSFET Device with Various PMA Conditions 