Research Article

Film Thickness Analysis for EHL Contacts under Steady-State and Transient Conditions by Automatic Digital Image Processing

Figure 3

Wrapped phase map of a white light interferogram of an EHL point contact (a) and wrapped (b) and unwrapped (c) hue values along the horizontal line.
325187.fig.003a
(a)
325187.fig.003b
(b)
325187.fig.003c
(c)