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Advances in Tribology
Volume 2013, Article ID 657363, 8 pages
Research Article

A Correlative Defect Analyzer Combining Glide Test with Atomic Force Microscope

1Institute of Engineering, College of Engineering, Peking University, Nanjing, Jiangsu 210012, China
2MicroFocus Technologies, Inc., Wuxi, Jiangsu 214125, China

Received 2 January 2013; Accepted 11 February 2013

Academic Editor: Tom Karis

Copyright © 2013 Jizhong He. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


We have developed a novel instrument combining a glide tester with an Atomic Force Microscope (AFM) for hard disk drive (HDD) media defect test and analysis. The sample stays on the same test spindle during both glide test and AFM imaging without losing the relevant coordinates. This enables an in situ evaluation with the high-resolution AFM of the defects detected by the glide test. The ability for the immediate follow-on AFM analysis solves the problem of relocating the defects quickly and accurately in the current workflow. The tool is furnished with other functions such as scribing, optical imaging, and head burnishing. Typical data generated from the tool are shown at the end of the paper. It is further demonstrated that novel experiments can be carried out on the platform by taking advantage of the correlative capabilities of the tool.