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Advances in Tribology
Volume 2013, Article ID 657363, 8 pages
Research Article

A Correlative Defect Analyzer Combining Glide Test with Atomic Force Microscope

1Institute of Engineering, College of Engineering, Peking University, Nanjing, Jiangsu 210012, China
2MicroFocus Technologies, Inc., Wuxi, Jiangsu 214125, China

Received 2 January 2013; Accepted 11 February 2013

Academic Editor: Tom Karis

Copyright © 2013 Jizhong He. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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