International Journal of Photoenergy has retracted the article titled “Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor” [1], as it is essentially identical in content with a previously published paper [2]. In particular, the article contains identical figures (namely Figures 4b, 5a, and 5b) with the above mentioned paper. While in the earlier published paper, the figures described the Ru-complex attached to TiO2, the same figures have now been used in this article to describe the electron transfer between the Ru-complex and the SnO2 semiconductor.
Retraction | Open Access
Retracted: Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor
Received24 Aug 2020
Accepted24 Aug 2020
Published28 Nov 2020
References
R. Ghanem, “Light-Induced Tyrosine Radical Formation from Ruthenium-Tyrosine Complex Anchored to SnO2 Semiconductor,” International Journal of Photoenergy, vol. 2008, Article ID 524142, 7 pages, 2008.
View at: Publisher Site | Google ScholarY. Xu, J. Pan, T. Hoffmann et al., “Light-Driven Tyrosine Radical Formation in a Ruthenium−Tyrosine Complex Attached to Nanoparticle TiO2,” Inorganic Chemistry, vol. 41, no. 24, pp. 6258–6266, 2002.
View at: Publisher Site | Google Scholar
Copyright
Copyright © 2020 International Journal of Photoenergy. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.