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Journal of Nanomaterials
Volume 2009, Article ID 936863, 11 pages
http://dx.doi.org/10.1155/2009/936863
Research Article

Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits

1Instituto de Ciencia de Materiales de Aragón, Facultad de Ciencias, Consejo Superior de Investigaciones Científicas (CSIC), Universidad de Zaragoza, 50009 Zaragoza, Spain
2Departamento de Fìsica de la Materia Condensada, Facultad de Ciencias, Universidad de Zaragoza, 50009 Zaragoza, Spain
3Instituto de Nanociencia de Aragón, Universidad de Zaragoza, 50009 Zaragoza, Spain

Received 20 October 2008; Revised 19 January 2009; Accepted 3 February 2009

Academic Editor: Xuedong Bai

Copyright © 2009 J. M. De Teresa et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

J. M. De Teresa, R. Córdoba, A. Fernández-Pacheco, O. Montero, P. Strichovanec, and M. R. Ibarra, “Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits,” Journal of Nanomaterials, vol. 2009, Article ID 936863, 11 pages, 2009. https://doi.org/10.1155/2009/936863.