Journal of Nanomaterials / 2009 / Article / Fig 5

Research Article

Origin of the Difference in the Resistivity of As-Grown Focused-Ion- and Focused-Electron-Beam-Induced Pt Nanodeposits

Figure 5

In-situ four-probe current-versus-voltage measurements of FEBID and FIBID Pt deposits similar to those of Figure 3. (a) The measurements in the FIBID Pt nanowire indicate linear dependence between current and applied voltage. The inset shows a SEM picture where the 4 electrical microprobes and the Pt-based gas injector can be located in the vicinity of the area of interest for the realization of the current-versus-voltage measurements. (b) whereas those in the FEBID Pt nanowire indicate non-linear dependence. The inset shows the anomalous dependence of conductance versus voltage, which is explained in the text.
936863.fig.005a
(a) FIBID Pt 300 K
936863.fig.005b
(b) FEBID Pt 300 K

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