Research Article

Temperature-Dependent Physical and Memory Characteristics of Atomic-Layer-Deposited RuO𝑥 Metal Nanocrystal Capacitors

Figure 5

Variation of diameter and density of the R u O 𝑥 metal nanocrystals with different annealing temperatures from 850–1000°C. A single R u O 𝑥 nanocrystal is shown in the inset for each annealing temperature.
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