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Journal of Nanomaterials
Volume 2014 (2014), Article ID 276143, 6 pages
Research Article

Preparation and Characterization of Graphene Oxide

1College of Environment and Materials Engineering, Yantai University, 30 Qingquan Road, Laishan District, Yantai 264005, China
2Department of Environmental Engineering, Ilan University, No. 1, Section 1 Shen-Lung Road, Yilan City 26047, Taiwan

Received 11 December 2013; Accepted 9 February 2014; Published 11 March 2014

Academic Editor: Wen Lei

Copyright © 2014 Jianguo Song et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Graphene oxide (GO) films with two-dimensional structure were successfully prepared via the modified Hummer method. It is proven that redox method is a promising way to synthesize GO films on a large scale. Comprehensive characterizations of the properties of GO films were conducted. TEM and DFM analyses showed that GO sheets prepared in this study had single and double lamellar layer structure and a thickness of 2~3 nm. X-ray diffraction (XRD) was selected to measure the crystal structure of GO sheet. Fourier-transform infrared spectra analyzer (FT-IR) was used to certify the presence of oxygen-containing functional groups in GO films. The tests of UV-VIS spectrometer and TGA analyzer indicated that GO sheet possessed excellent optical response and outstanding thermal stability. Elemental analyzer (EA) and X-ray photoelectron spectroscope (XPS) analyzed the components synthetic material. Simultaneously, chemical structure of GO sheet was described in this study. Discussion and references for further research on graphene are provided.