Void Structures in Regularly Patterned ZnO Nanorods Grown with the Hydrothermal Method

Figure 5

(a) Cross-sectional TEM image of a Ga-doped ZnO NR thermally annealed at 400°C with ambient oxygen for 60 min (the same as the sample shown in Figure 4(d)). (b) and (c) Atomic-scale TEM images in the regions marked with the two rectangles in part (a). (d) and (e) Fourier-transform patterns of the images in parts (b) and (c), respectively.