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Journal of Nanomaterials
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Journal of Nanomaterials
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2014
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Article
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Fig 2
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Research Article
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
Figure 2
Drain current noise spectral density (
) versus frequency for HK pMOSFET with and without embedded SiGe S/D.