Strain Driven Phase Decomposition in Ion-Beam Sputtered Pr_1−XCa_XMnO₃ Films

Figure 6

Outgrowth density and the influence of Mn excess for samples with . (a) SEM picture of a PCMO film (G03_1) with a small Mn deficit () on STO. (b) Surface density of outgrowths in dependence on the Mn excess. The Mn excess was deduced from EDX measurements using linear fits of the concentration profile (see also Figure 2(c)). The error bar represents the uncertainness in the concentration measurement. Same symbols belong to samples prepared in the same deposition run. The respective stoichiometric samples () are B03_1 (black squares, substrate Pt/MgO, and sputter gas Xe), F03_1a (red circles, STO, and Xe), and D03_1a (blue diamonds, STO, and Ar). (c) SEM picture of a PCMO film on MgO (F03_1b). The film has the same composition (, ) and was prepared in the same run as the sample F03_1a on STO shown in Figure 1(a). (d) XRD patterns of two PCMO films (, ) on MgO prepared in different runs. The sample marked by solid symbols reveals outgrowths; the second film (F03_1b, solid line) is free of outgrowths.

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