Epitaxial Growth of Ru and Pt on Pt(111) and Ru(0001), Respectively: A Combined AES and RHEED Study
Figure 1
(1 × 1) RHEED patterns ([] (a) and [] (b)) for Ru(0001) after argon ion sputtering and annealing at 1300 K under UHV conditions, showing 2D reflection streaks of the (±10) and (±11) beams; the RHEED patterns ([] (c) and [] (d)) for Ru(0001) electrode covered by submonolayer Pt, showing intensity modulation along the substrate reflection rods; the RHEED pattern ([]) for the Ru(0001) electrode covered by Pt deposit after second spontaneous deposition, showing additional reflection depicted by the arrow along the Ru substrate reflections (±10); the RHEED patterns ([] (f) and [] (g)) for the Ru(0001) electrode covered by Pt (>1 ML) by spontaneous deposition (>3 min), showing 3D spots due to the Pt clusters; the indexed reciprocal lattice (h) of Figure 1(g); the RHEED pattern [] (i) and its indexed reciprocal lattice (j) for the Ru(0001) electrode covered by Pt (>1 ML) by electrodeposition; (k) the indexed reciprocal lattices of the matrix and the twin for the marked part of Figure 1(j).