Modeling, Simulation, and Analysis of Novel Threshold Voltage Definition for Nano-MOSFET

Table 2

Comparison of V_TH extraction methods for 180 nm test device.

Method	VDS	VTLIN
Hybrid extrapolation extraction method	0 V	0.575 V
Linear extrapolation method (LEM)	0.1 V	0.585 V
Second derivative method (SDM)	0.1 V	0.585 V
Ghibaudo method (GM)	0.1 V	0.58 V
Match point method (MPM)	0.1 V	0.58 V