Thickness Measurement of V₂O₅ Nanometric Thin Films Using a Portable XRF

Table 3

Analysis of adjustment variance of the model presented in Figure 7.

Model	Source of variation	Quadratic sum	Degrees of liberty	Quadratic average
	Regression	0.70939	1	0.70939	0.98
	Residues	0.00102	6	0.00204
	Total	0.71041	7