Research Article

Analysis of the Degradation of MOSFETs in Switching Mode Power Supply by Characterizing Source Oscillator Signals

Table 2

The results of states of health.

(Hz)Experiment (mΩ)Datasheet (mΩ)Error (%)Health

1321 43.6644−0.77Normal
1408 46.43445.52Normal
1493 48.35449.89Degradation
1604 58.564433.09Degradation
1832 60.644437.82Degradation
1990 65.774449.48Degradation