Research Article

A New Lifetime Exponential-X Family of Distributions with Applications to Reliability Data

Table 2

Simulation results of NLTE-W distribution.

Set 1: , , and

ParametersMLEMSEsBiases

250.54701.0176e − 024.7049e − 02
1.37395.7227e − 011.7393e − 01
1.00604.6356e − 010.1061

500.51973.0224e − 031.9750e − 02
1.33329.9853e − 023.3231e − 02
0.90831.2798e − 010.0083

1000.50535.9972e − 045.3831e − 03
1.29905.5752e − 03−4.4566e − 05
0.89081.8679e − 02−0.0091

2000.50424.9037e − 055.3695e − 04
1.25436.5797e − 05−6.3885e − 04
0.89854.0895e − 04−0.0014

3000.50322.2459e − 065.4722e − 05
1.23985.7826e − 06−8.7809e − 05
0.89984.0526e − 05−0.0002

4000.50143.9207e − 052.2864e − 04
1.21704.2641e − 05−2.3844e − 04
0.90006.9245e − 04−0.0009

5000.50000.0000e + 000.0000e + 00
1.20000.0000e + 000.0000e + 00
0.90000.0000e + 000.0000e + 00

6000.50000.0000e + 000.0000e + 00
1.20000.0000e + 000.0000e + 00
0.90000.0000e + 000.0000e + 00

7000.50000.0000e + 000.0000e + 00
1.20000.0000e + 000.0000e + 00
0.90000.0000e + 000.0000e + 00

7500.50000.0000e + 000.0000e + 00
1.20000.0000e + 000.0000e + 00
0.90000.0000e + 000.0000e + 00