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Modelling and Simulation in Engineering
Volume 2011, Article ID 541743, 7 pages
http://dx.doi.org/10.1155/2011/541743
Research Article

Coupling and Shielding Properties of the Baffle in ICP System

1Technology Development Center, TEL US Holdings Inc., Suite 244, 255 Fuller Road, Albany, NY 12203, USA
2TEL Technology Center America LLC, Suite 244, 255 Fuller Road, Albany, NY 12203, USA

Received 28 October 2010; Accepted 13 June 2011

Academic Editor: Agostino Bruzzone

Copyright © 2011 Jozef Brcka and R. Lee Robison. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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