Table of Contents
VLSI Design
Volume 1, Issue 1, Pages 23-44

Built-In Self-Test: Milestones and Challenges

IBM, Data Systems Division, Poughkeepsie, New York, USA

Copyright © 1993 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


This paper describes the progress in built-in self-test (BIST) since its inception, and the important problems that still need to be solved to make the technique widely acceptable. The paper includes a reference list and an extensive bibliography on the subject matter.