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VLSI Design
Volume 1 (1993), Issue 1, Pages 23-44

Built-In Self-Test: Milestones and Challenges

IBM, Data Systems Division, Poughkeepsie, New York, USA

Copyright © 1993 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Jacob Savir and Paul H. Bardell, “Built-In Self-Test: Milestones and Challenges,” VLSI Design, vol. 1, no. 1, pp. 23-44, 1993. doi:10.1155/1993/81360