VLSI Design

VLSI Design / 1994 / Article
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Digital Hardware Testing

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Volume 2 |Article ID 071941 | https://doi.org/10.1155/1994/71941

Hyung K. Lee, Dong S. Ha, "An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits", VLSI Design, vol. 2, Article ID 071941, 9 pages, 1994. https://doi.org/10.1155/1994/71941

An Efficient Automatic Test Pattern Generator for Stuck-Open Faults in CMOS Combinational Circuits

Received15 Nov 1990
Revised08 Mar 1991


In this paper, we describe a highly efficient automatic test pattern generator for stuck-open (SOP) faults, called SOPRANO, in CMOS combinational circuits. The key idea of SOPRANO is to convert a CMOS circuit into an equivalent gate level circuit and SOP faults into the equivalent stuck-at faults. Then SOPRANO derives test patterns for SOP faults using a gate level test pattern generator. Several techniques to reduce the test set size are introduced in SOPRANO. Experimental results performed on eight benchmark circuits show that SOPRANO achieves high SOP fault coverage and short processing time.

Copyright © 1994 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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