Table of Contents
VLSI Design
Volume 1, Issue 4, Pages 313-326
http://dx.doi.org/10.1155/1994/78932

Empirical Bounds on Fault Coverage Loss Due to LFSR Aliasing

Rome Laboratory (RL/ERDA), Griffiss AFB, New York, USA

Copyright © 1994 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [1 citation]

The following is the list of published articles that have cited the current article.

  • Agees Kumar C., Sivarani T.S., and Joseph Jawhar S., “Intensive random carrier pulse width modulation for induction motor drives based on hopping between discrete carrier frequencies,” IET Power Electronics, 2016. View at Publisher · View at Google Scholar