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VLSI Design
Volume 4, Issue 3, Pages 231-242
http://dx.doi.org/10.1155/1996/80472

Fault Modeling of ECL for High Fault Coverage of Physical Defects

1Dept. of Electrical & Computer Engineering, South Dakota School of Mines & Technology, Rapid City, SD 57701, USA
2Dept. of Computer Science, Colorado State University, Fort Collins, CO 80523, USA

Copyright © 1996 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Sankaran M. Menon, Yashwant K. Malaiya, and Anura P. Jayasumana, “Fault Modeling of ECL for High Fault Coverage of Physical Defects,” VLSI Design, vol. 4, no. 3, pp. 231-242, 1996. https://doi.org/10.1155/1996/80472.