Table of Contents
VLSI Design
Volume 11, Issue 1, Pages 1-21
http://dx.doi.org/10.1155/2000/84720

New Self-dual Circuits for Error Detection and Testing

1University of Potsdam, Department of Computer Science, Fault Tolerant Computing Group, PSF 601553, Potsdam D-14415 , Germany
2Railway Transportation State University, Moskovskij pr. 9, SU190031 St.-Petersburg, Russia

Received 1 April 1999; Accepted 5 October 1999

Copyright © 2000 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

A. Dmitriev, V. Saposhnikov, Vl. Saposhnikov, M. Goessel, Vl. Moshanin, and A. Morosov, “New Self-dual Circuits for Error Detection and Testing,” VLSI Design, vol. 11, no. 1, pp. 1-21, 2000. https://doi.org/10.1155/2000/84720.