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VLSI Design
Volume 2010 (2010), Article ID 156829, 12 pages
http://dx.doi.org/10.1155/2010/156829
Research Article

A SiGe BiCMOS Instrumentation Channel for Extreme Environment Applications

1Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA
2Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701, USA
3Power and Sensor Electronics, Jet Propulsion Laboratory, Pasadena, CA 91109, USA
4Instrument Electronics and Sensors, Jet Propulsion Laboratory, Pasadena, CA 91109, USA
5Space Products and Systems, BAE Systems, Manassas, VA 20110, USA
6School of Electrical and Computer Engineering, Georgia Institute of Technology, tlanta, GA 30332, USA

Received 6 June 2009; Accepted 2 November 2009

Academic Editor: Ethan Farquhar

Copyright © 2010 Chandradevi Ulaganathan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [3 citations]

The following is the list of published articles that have cited the current article.

  • Ryan M. Diestelhorst, Troy D. England, Richard Berger, Ray Garbos, Chandradevi Ulaganathan, Ben Blalock, Kimberly Cornett, Alan Mantooth, Xueyang Geng, Foster Dai, Wayne Johnson, Jim Holmes, Mike Alles, Robert Reed, Patrick McCluskey, Mohammad Mojarradi, Leora Peltz, Robert Frampton, Cliff Eckert, and John D. Cressler, “A new approach to designing electronic systems for operation in extreme environments: Part I - The SiGe Remote Sensor Interface,” IEEE Aerospace and Electronic Systems Magazine, vol. 27, no. 6, pp. 25–34, 2012. View at Publisher ยท View at Google Scholar
  • John D. Cressler, “Radiation Effects in SiGe Technology,” Ieee Transactions On Nuclear Science, vol. 60, no. 3, pp. 1992–2014, 2013. View at Publisher ยท View at Google Scholar
  • Samuel Sordo-Ibanez, Blanca Pinero-Garcia, Manuel Munoz-Diaz, Antonio Ragel-Morales, Joaquin Ceballos-Caceres, Luis Carranza-Gonzalez, Servando Espejo-Meana, Alberto Arias-Drake, Juan Ramos-Martos, Jose Miguel Mora-Gutierrez, and Miguel Angel Lagos-Florido, “CMOS Rad-Hard Front-End Electronics for Precise Sensors Measurements,” IEEE Transactions on Nuclear Science, vol. 63, no. 4, pp. 2379–2389, 2016. View at Publisher ยท View at Google Scholar