VLSI Design

Computional Electronics; Papers Presented at The Seventh International Workshop on Computional Electronics


Status
Published

Guest Editors
John Barker | Jeremy Watling

Computional Electronics; Papers Presented at The Seventh International Workshop on Computional Electronics

Articles

  • Special Issue
  • - Volume 13
  • - Article ID 026849

An Upstream Flux Splitting Method for Hydrodynamic Modeling of Deep Submicron Devices

Min Shen | Wai-Kay Yip | ... | J. J. Liou
  • Special Issue
  • - Volume 13
  • - Article ID 016196

Three-dimensional Statistical Modeling of the Effects of the Random Distribution of Dopants in Deep Sub-micron nMOSFETs

E. Amirante | G. Iannaccone | B. Pellegrini
  • Special Issue
  • - Volume 13
  • - Article ID 035094

Approximation of the BTE by a Relaxation-time Operator: Simulations for a 50 nm-channel Si Diode

Marcello A. Anile | Jose A. Carrillo | ... | Chi-Wang Shu
  • Special Issue
  • - Volume 13
  • - Article ID 024258

Numerical Studies of Miniband Conduction in Quasi-One-Dimensional Superlattices

N. Mori | C. Hamaguchi | ... | P. C. Main
  • Special Issue
  • - Volume 13
  • - Article ID 068217

Influence of Electron-Electron Interaction on Electron Distributions in Short Si-MOSFETs Analysed Using the Local Iterative Monte Carlo Technique

T. Mietzner | J. Jakumeit | U. Ravaioli
  • Special Issue
  • - Volume 13
  • - Article ID 086126

Numerical Simulation of Quantum Logic Gates Based on Quantum Wires

A. Bertoni | P. Bordone | ... | S. Reggiani
  • Special Issue
  • - Volume 13
  • - Article ID 070635

Cluster-based Parallel 3-D Monte Carlo Device Simulation

Asim Kepkep | Umberto Ravaioli | Brian Winstead
  • Special Issue
  • - Volume 13
  • - Article ID 036165

A Generalized Finite Element Method for Hydrodynamic Modeling of Short-channel Devices

Min Shen | Ming-C. Cheng | J. J. Liou
  • Special Issue
  • - Volume 13
  • - Article ID 039729

Self-consistent Full-band Modeling of Quantum Semiconductor Nanostructures

Francesco Chirico | Aldo Di Carlo | Paolo Lugli
  • Special Issue
  • - Volume 13
  • - Article ID 070818

Simulation of Enhanced Interface Trapping Due to Carrier Dynamics in Warped Valence Bands in SiGe Devices

J. R. Barker | J. R. Watling

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