Surface and Interface Properties of 10–12 Unit Cells Thick Sputter Deposited Epitaxial CeO2 Films
Figure 3
(a) XRR and
(b) AFM measurements on 10–12 unit cell thick epitaxial ceria film. Insets
of (a) and (b) represent an XRD scan and AFM image of the as-received YSZ
substrate, respectively.
