Surface and Interface Properties of 10–12 Unit Cells Thick Sputter Deposited Epitaxial CeO₂ Films

Figure 4

(a) Out-of-plane (200) and (b) in-plane (420) XRD scans of 10–12 unit cell thick ceria film, necessary to calculate the respective lattice parameters. The insets indicate visualization of (200) and (420) planes in a ceria lattice.

(a)

(b)