Fabrication and Characterization of Copper System Compound Semiconductor Solar Cells

Figure 3

XRD pattern of (a) CIS thin film and (b) TiO₂ thin film annealed at 450^∘C for 30 minutes in air and 500^∘C for 30 minutes in N₂/H₂ atmosphere and (c) TiO₂ thin film annealed at 450^∘C for 30 minutes in air.

(a)

(b)

(c)