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Advances in Materials Science and Engineering
Volume 2010, Article ID 710269, 7 pages
http://dx.doi.org/10.1155/2010/710269
Research Article

Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

1Laboratório Interdisciplinar em Cerâmica, Departamento de Físico-Química, Instituto de Química, Universidade Estadual Paulista, R. Francisco Degni, s/n, Bairro Quitandinha, 14801-970 Araraquara, SP, Brazil
2Universidade Federal de Itajubá-Unifei, Campus Itabira, Rua São Paulo, 377, 35900-373 Bairro Amazonas-Itabira MG, Brazil

Received 5 February 2010; Accepted 6 April 2010

Academic Editor: Zoe Barber

Copyright © 2010 G. Biasotto et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

G. Biasotto, A. Z. Simões, C. S. Riccardi, M. A. Zaghete, E. Longo, and J. A. Varela, “Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy,” Advances in Materials Science and Engineering, vol. 2010, Article ID 710269, 7 pages, 2010. https://doi.org/10.1155/2010/710269.