Morphology of Near- and Semispherical Melted Chips after the Grinding Processes Using Sol-Gel Abrasives Based on SEM-Imaging and Analysis

<div>General morphology of cluster of near-spherical melted chips formed after internal cylindrical traverse grinding of 100Cr6 steel alloy obtained by use of scanning electron microscope JSM-550LV produced by JEOL: (a) SEM micrograph (size: 251.42 × 142.85 <i>μ</i>m, mag. 500×) of GWAS 1–35 × 20 × 10-SG/F46K7VTO, showing area of concentration (cluster) of single near-spherical melted chips, (b) AOI (size: 41.42 × 41.42 <i>μ</i>m, mag. 1000×) extracted from (a), (c) AOI (size: 101.89 × 85.25 <i>μ</i>m, mag. 2000×) extracted from (b), and (d) SEM micrograph prepared for quantitative analysis in Image-Pro Plus 5.0 software. Note: Acc. voltage, accelerating voltage; BES, backscattered electron (shadow image); WD, working distance.</div>

Advances in Materials Science and Engineering

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Figure 5

Figure 5: Morphology of Near- and Semispherical Melted Chips after the Grinding Processes Using Sol-Gel Abrasives Based on SEM-Imaging and Analysis 