Figure 5: General morphology of cluster of near-spherical melted chips formed after internal cylindrical traverse grinding of 100Cr6 steel alloy obtained by use of scanning electron microscope JSM-550LV produced by JEOL: (a) SEM micrograph (size: 251.42 × 142.85 μm, mag. 500×) of GWAS 1–35 × 20 × 10-SG/F46K7VTO, showing area of concentration (cluster) of single near-spherical melted chips, (b) AOI (size: 41.42 × 41.42 μm, mag. 1000×) extracted from (a), (c) AOI (size: 101.89 × 85.25 μm, mag. 2000×) extracted from (b), and (d) SEM micrograph prepared for quantitative analysis in Image-Pro Plus 5.0 software. Note: Acc. voltage, accelerating voltage; BES, backscattered electron (shadow image); WD, working distance.