Advances in Materials Science and Engineering / 2017 / Article / Fig 8

Research Article

Determination of Optical Properties of Thin Films from Ketteler-Helmholtz Dispersion Relations: Application to the Case of Ultraviolet Irradiated Zirconium Oxide

Figure 8

Comparison of the real (a) and imaginary (b) parts of the complex refractive index for the UV-exposed thin film (see Figure 6).