Research Article
Novel Low-Permittivity (Mg1−xCux)2SiO4 Microwave Dielectric Ceramics
Figure 3
SEM images of (Mg0.95Cu0.05)2SiO4 with 12% B2O3–LiF sintered at (a) 1000°C, (b) 1050°C, (c) 1100°C, (d) 1150°C, (e) 1200°C, and (f) EDS pattern of microdomain marked in Figure 3(d).
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