Poole–Frenkel Emission Saturation and Its Effects on Time-to-Failure in Ta-Ta<sub>2</sub>O<sub>5</sub>-MnO<sub>2</sub> Capacitors

<div>PF emission saturation currents of failed samples as sorted by time-to-failure in ascending order for 35 V 22 <i>μ</i>F chip tantalum capacitors after 1.6xVr at 85°C for 100,000 s.</div>

Advances in Materials Science and Engineering

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Figure 9

Figure 9: Poole–Frenkel Emission Saturation and Its Effects on Time-to-Failure in Ta-Ta<sub>2</sub>O<sub>5</sub>-MnO<sub>2</sub> Capacitors 

Advances in Materials Science and Engineering

Poole–Frenkel Emission Saturation and Its Effects on Time-to-Failure in Ta-Ta2O5-MnO2 Capacitors

Figure 9

Poole–Frenkel Emission Saturation and Its Effects on Time-to-Failure in Ta-Ta₂O₅-MnO₂ Capacitors