Research Article
The Effect of Yttrium Addition on the Microstructures and Electrical Properties of CuMn Alloy Thin Films
Figure 1
CuMnY thin-film X-ray diffraction patterns with various amounts of yttrium addition annealed at (a) 250°C, (b) 300°C, and (c) 350°C.
(a) |
(b) |
(c) |