FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials

<div>The resolution of modern tomographic characterization methods is displayed as an approximate range. Dash lines represent advanced potential range [<a href="/journals/amse/2019/8680715/#B26">26</a>, <a href="/journals/amse/2019/8680715/#B43">43</a>–<a href="/journals/amse/2019/8680715/#B47">47</a>].</div>

Advances in Materials Science and Engineering

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Figure 3

Figure 3: FIB-SEM Three-Dimensional Tomography for Characterization of Carbon-Based Materials 