Research Article
Influence of Crystallization Temperature on Structural, Ferroelectric, and Ferromagnetic Properties of Lead-Free Bi0.5(Na0.8K0.2)0.5TiO3 Multiferroic Films
Figure 2
X-ray diffraction patterns of BNKT films in the 2θ ranges of (a) 25°–75° and (b) 46–48°.
(a) |
(b) |