Review Article

Novel Au-Based Solder Alloys: A Potential Answer for Electrical Packaging Problem

Table 3

Shear strength of Au-Si eutectic alloys with Cu/Au and ENIG UBM before and after thermal aging at 300°C for various durations [47].

Solder jointAging time (h)Shear strength at RT (g·mil−2)Shear strength at 250°C (g·mil−2)

Au-Si/Au/Cu06.55.2
1004.73.3
3002.21.7
5001.81.3

Au-Si/ENIG06.95.9
10065
3005.84.6
50054