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Advances in Materials Science and Engineering
/
2020
/
Article
/
Tab 3
/
Review Article
Novel Au-Based Solder Alloys: A Potential Answer for Electrical Packaging Problem
Table 3
Shear strength of Au-Si eutectic alloys with Cu/Au and ENIG UBM before and after thermal aging at 300°C for various durations [
47
].
Solder joint
Aging time (h)
Shear strength at RT (g·mil
−2
)
Shear strength at 250°C (g·mil
−2
)
Au-Si/Au/Cu
0
6.5
5.2
100
4.7
3.3
300
2.2
1.7
500
1.8
1.3
Au-Si/ENIG
0
6.9
5.9
100
6
5
300
5.8
4.6
500
5
4