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Editorial Board
- Arvind Agarwal, Florida International University, USA
- Mihai Arghir, Université de Poitiers, France
- Pranesh B. Aswath, University of Texas at Arlington, USA
- Shyam Bahadur, Iowa State University, USA
- Huseyin Çimenoǧlu, Istanbul Technical University, Turkey
- Enrico Ciulli, Università di Pisa, Italy
- João P. Davim, University of Aveiro, Portugal
- Patrick De Baets, Ghent University, Belgium
- Abdallah Elsharkawy, Kuwait University, Kuwait
- Liang Fang, Xi'an Jiaotong University, China
- Kambiz Farhang, Southern Illinois University, USA
- Michel Fillon, University of Poitiers, France
- Klaus Friedrich, University of Kaiserslautern, Germany
- Meng Hua, City University of Hong Kong, Hong Kong
- Said Jahanmir, National Institute of Standards and Technology, USA
- GunHee Jang, Hanyang University, Republic of Korea
- Motohiro Kaneta, Kyushu Institute of Technology, Japan
- Yuan Kang, Chung Yuan Christian University, Taiwan
- Ajay Kapoor, Swinburne University, Australia
- Michael M. Khonsari, Louisiana State University, USA
- Dae-Eun Kim, Yonsei University, Republic of Korea
- Braham Prakash, Luleå University of Technology, Sweden
- Jerzy T. Sawicki, Cleveland State University, USA
- Ian Sherrington, University of Central Lancashire, United Kingdom
- Gwidon Stachowiak, University of Western Australia, Austria
- Andras Z. Szeri, University of Delaware, USA
- Anna Walicka, University of Zielona Gora, Poland
- Si-Wei Zhang, University of Petroleum, China