Active and Passive Electronic Components

Table of Contents: 1977

  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 130701
  • - Short Communication

The Effect of Thin Film Deposition Angle and Substrate Surface Roughness on Film Dissolution in Molten 60% Sn–40% Pb Solder

L. J. Rickabaugh
  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 403247

New Approaches to the Direct Measurement of Capacitance

M. S. Raven | D. Raven
  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 328531

UHV – Deposited Amorphous Tantalum and Tantalum–Nickel Films

Alfred Schäfer | Günther Menzel
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 760329

Book Review

P. L. Moran
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 286256

Economics of Thick and Thin Film Hybrid Production in Europe

D. Boswell | D. S. Campbell
  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 829678

Determination of Dielectric Constant of Stearic Acid Films Using Varying Gap Immersion Method

V. K. Agarwal | B. Ichijo
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 527981

Book Reviews

D. S. Campbell
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 879204

The Reliability, Testing and Evaluation of Hybrid Microcircuits

A. H. George
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 129897

Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors

A. Cattaneo | M. Cocito | ... | M. Prudenziati
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 472914

Electrochromic Displays

R. Hurditch
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 289208

Factors Affecting Laser-Trim Stability of Thick Film Resistors

R. E. Cote | R. C. Headley | ... | A. Howe
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 723768

A High Speed ECL Multiplexer in Beam Lead, Hybrid Technology

J. B. Coughlin | J. B. Hughes | ... | F. W. Siegert
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 178975

Failure Mechanisms in Solid Electrolytic Capacitors

J. Brettle | N. F. Jackson
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 359138

Comparison of Arc Erosive and Laser Beam Trimming of Thin Film Resistors

Zs. Illyefalvi-Vitéz
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 241310

Electrolytic Oxidation of Semiconductor Surfaces

H. L. Hartnagel
Active and Passive Electronic Components
 Journal metrics
See full report
Acceptance rate10%
Submission to final decision90 days
Acceptance to publication14 days
CiteScore1.500
Journal Citation Indicator0.080
Impact Factor0.4
 Submit Evaluate your manuscript with the free Manuscript Language Checker

We have begun to integrate the 200+ Hindawi journals into Wiley’s journal portfolio. You can find out more about how this benefits our journal communities on our FAQ.