Advances in Materials Science and Engineering / 2010 / Article / Fig 1

Research Article

Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

Figure 1

X-ray diffraction for CBTi144 thin film deposited on (100) Pt/Ti/SiO2/Si substrate at 700 C for 2 hours.
710269.fig.001

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