Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy

<table>(a) A plan-view TEM micrograph and (b) Selected area diffraction (SAD) pattern for CBTi144 film deposited by the soft chemical method at 700<svg height="12.9375" id="M15" style="vertical-align:-0.0pt" version="1.1" viewbox="0 0 5.1624999 12.9375" width="5.1624999" xmlns="http://www.w3.org/2000/svg" xmlns:xlink="http://www.w3.org/1999/xlink">
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</svg>C for 2 hours.</table>

Advances in Materials Science and Engineering

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Figure 4

Figure 4: Retention Characteristics of CBTi144 Thin Films Explained by Means of X-Ray Photoemission Spectroscopy 