Joel Molina

0000-0002-5681-1713

Articles in Scholarly Journals [Incomplete List]

  1. Effects of N[sub 2]-Based Annealing on the Reliability Characteristics of Tungsten/La[sub 2]O[sub 3]/Silicon Capacitors
    Journal of The Electrochemical Society, vol. 154, no. 5, p. G110, 2007