Active and Passive Electronic Components

Table of Contents: 1977

  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 130701
  • - Short Communication

The Effect of Thin Film Deposition Angle and Substrate Surface Roughness on Film Dissolution in Molten 60% Sn–40% Pb Solder

L. J. Rickabaugh
  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 403247

New Approaches to the Direct Measurement of Capacitance

M. S. Raven | D. Raven
  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 328531

UHV – Deposited Amorphous Tantalum and Tantalum–Nickel Films

Alfred Schäfer | Günther Menzel
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 760329

Book Review

P. L. Moran
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 286256

Economics of Thick and Thin Film Hybrid Production in Europe

D. Boswell | D. S. Campbell
  • ElectroComponent Science and Technology -
  • Special Issue
  • Volume 4
  • - Article ID 829678

Determination of Dielectric Constant of Stearic Acid Films Using Varying Gap Immersion Method

V. K. Agarwal | B. Ichijo
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 527981

Book Reviews

D. S. Campbell
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 879204

The Reliability, Testing and Evaluation of Hybrid Microcircuits

A. H. George
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 129897

Influence of the Metal Migration From Screen-and-Fired Terminations on the Electrical Characteristics of Thick-Film Resistors

A. Cattaneo | M. Cocito | ... | M. Prudenziati
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 472914

Electrochromic Displays

R. Hurditch
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 289208

Factors Affecting Laser-Trim Stability of Thick Film Resistors

R. E. Cote | R. C. Headley | ... | A. Howe
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 723768

A High Speed ECL Multiplexer in Beam Lead, Hybrid Technology

J. B. Coughlin | J. B. Hughes | ... | F. W. Siegert
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 178975

Failure Mechanisms in Solid Electrolytic Capacitors

J. Brettle | N. F. Jackson
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 4
  • - Article ID 359138

Comparison of Arc Erosive and Laser Beam Trimming of Thin Film Resistors

Zs. Illyefalvi-Vitéz
  • ElectroComponent Science and Technology -
  • Special Issue
  • - Volume 3
  • - Article ID 241310

Electrolytic Oxidation of Semiconductor Surfaces

H. L. Hartnagel
Active and Passive Electronic Components
 Journal metrics
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Acceptance rate10%
Submission to final decision90 days
Acceptance to publication14 days
CiteScore1.500
Journal Citation Indicator0.080
Impact Factor0.4
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